Classifying defects in topography images of silicon wafers. - Corinna Kofler; Gunter Spöck; Robert Muhr (WSC, 2017)

Detecting Star Cracks in Topography Images of Specular Back Surfaces of Structured Wafers. - Corinna Kofler; Robert Muhr; Gunter Spöck (ICMLA, 2018)

Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs. - Corinna Kofler; Robert Muhr; Gunter Spöck (Sensors, 2019)

Data-Centric Model Development to Improve the CNN Classification of Defect Density SEM Images. - Corinna Kofler; Claudia Anna Dohr; Judith Dohr; Anja Zernig (IECON, 2022)

Detection of Unknown Defects in Semiconductor Materials from a Hybrid Deep and Machine Learning Approach. - Francisco López de la Rosa; José Luis Gómez-Sirvent; Corinna Kofler; Rafael Morales 001; Antonio Fernández-Caballero 001 (IWINAC (1), 2022)