Benefits of field failure distribution modeling to the failure analysis. - Corinne Bergès; Julien Goxe (Microelectron. Reliab., 2013)

Risk and reliability assessment about a manufacturing issue in a power MOSFET for automotive applications. - Corinne Bergès; Pierre Soufflet; Abdeslam Jadrani (Microelectron. Reliab., 2014)

General linearized model use for High Power Reliability Assessment test results: Conditions, procedure and case study. - Corinne Bergès; Y. Weber; Pierre Soufflet (Microelectron. Reliab., 2015)

Leakage current study and relevant defect localization in integrated circuit failure analysis. - Chunlei Wu; Suying Yao; Corinne Bergès (Microelectron. Reliab., 2015)