Study of the ESD defects impact on ICs reliability. - Fabien Essely; Corinne Bestory; Nicolas Guitard; Marise Bafleur; A. Wislez; E. Doche; Philippe Perdu; André Touboul; Dean Lewis (Microelectron. Reliab., 2004)

Multi-level Modeling of Hot Carrier Injection for Reliability. - Corinne Bestory; François Marc; Hervé Levi; Yves Danto (FDL, 2006)

Statistical analysis during the reliability simulation. - Corinne Bestory; François Marc; Hervé Levi (Microelectron. Reliab., 2007)

Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. - Corinne Bestory; François Marc; S. Duzellier; Hervé Levi (Microelectron. Reliab., 2009)