Built-In Test for CMOS Circuits. - Corot W. Starke (ITC, 1984)

Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (ITC, 1986)

Aliasing Errors in Signature Analysis Registers. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (IEEE Des. Test, 1987)

Bounds and analysis of aliasing errors in linear feedback shift registers. - Tom W. Williams; Wilfried Daehn; Matthias Gruetzner; Corot W. Starke (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1988)

Iterative algorithms for computing aliasing probabilities. - André Ivanov; Corot W. Starke; Vinod K. Agarwal; Wilfried Daehn; Matthias Gruetzner; Tom W. Williams (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991)