The influence of hydrogen and nitrogen on the formation of Si nanoclusters embedded in sub-stoichiometric silicon oxide layers. - Liliana Caristia; Giuseppe Nicotra; Corrado Bongiorno; Nicola Costa; Sebastiano Ravesi; Salvo Coffa; Riccardo De Bastiani; Maria Grazia Grimaldi; Corrado Spinella (Microelectron. Reliab., 2007)

SiO2/4H-SiC interfacial chemistry as origin of the threshold voltage instability in power MOSFETs. - Patrick Fiorenza; Corrado Bongiorno; Angelo Alberto Messina; Mario Saggio; Filippo Giannazzo; Fabrizio Roccaforte (IRPS, 2022)