Impact of Technology Spreading on MEMS design Robustness. - Vincent Beroulle; Laurent Latorre; M. Dardalhon; Coumar Oudéa; Guy Perez; Francis Pressecq; Pascal Nouet (VLSI-SOC, 2001)

Reliability analysis of CMOS MEMS structures obtained by Front Side Bulk Micromachining. - M. Dardalhon; Vincent Beroulle; Laurent Latorre; Pascal Nouet; Guy Perez; Jean Marc Nicot; Coumar Oudéa (Microelectron. Reliab., 2002)

Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. - F. Saigné; Olivier Quittard; Laurent Dusseau; F. Joffre; Coumar Oudéa; J. Fesquet; Jean Gasiot (Microelectron. Reliab., 2002)

Application of MEMS behavioral simulation to Physics of Failure (PoF) modeling. - Petra Schmitt; Francis Pressecq; Xavier Lafontan; Q.-H. Duong; Patrick Pons; Jean Marc Nicot; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2003)

Impact of the space environmental conditions on the reliability of a MEMS COTS based system. - Petra Schmitt; Xavier Lafontan; Francis Pressecq; B. Kurz; Coumar Oudéa; Daniel Estève; Jean-Yves Fourniols; Henri Camon (Microelectron. Reliab., 2004)