High-frequency impedance of proton-bombarded injection lasers. - Basil W. Hakki; Walter R. Holbrook; Craig A. Gaw (Bell Syst. Tech. J., 1983)

Evaluation of SiGe: C HBT intrinsic reliability using conventional and step stress methodologies. - Craig A. Gaw; Thomas Arnold; Robert Martin; Lisa Zhang; Dragan Zupac (Microelectron. Reliab., 2006)

Reliability and performance of a true enhancement mode HIGFET for wireless applications. - Craig A. Gaw; Thomas Arnold; Elizabeth Glass; Robert Martin (Microelectron. Reliab., 2007)

Intrinsic reliability of a 12 V field plate pHEMT. - Craig A. Gaw; Thomas Arnold; Karen Moore (Microelectron. Reliab., 2008)