Predicting Time to Failure Using the IMM and Excitable Tests. - E. Phelps; Peter Willett 001; Thia Kirubarajan; Craig Brideau (IEEE Trans. Syst. Man Cybern. Part A, 2007)

The Problem of Test Latency in Machine Diagnosis. - Ozgur Erdinc; Craig Brideau; Peter Willett 001; Thia Kirubarajan (IEEE Trans. Syst. Man Cybern. Part A, 2008)

Fast Diagnosis With Sensors of Uncertain Quality. - Ozgur Erdinc; Craig Brideau; Peter Willett 001; Thiagalingam Kirubarajan (IEEE Trans. Syst. Man Cybern. Part B, 2008)

High-resolution fluorescence microscopy of myelin without exogenous probes. - Pia Crone Christensen; Craig Brideau; Kelvin W. C. Poon; Axinia Döring; V. Wee Yong; Peter K. Stys (NeuroImage, 2014)