The Mutating Metric for Benchmarking Test. - Rohit Kapur; Cy Hay; Thomas W. Williams (IEEE Des. Test Comput., 2000)

Hierarchical Compactor Design for Diagnosis in Deterministic Logic BIST. - Peter Wohl; John A. Waicukauski; Sanjay Patel; Cy Hay; Emil Gizdarski; Ben Mathew (VTS, 2005)

Accurately Determining Bridging Defects from Layout. - Maria Gkatziani; Rohit Kapur; Qing Su; Ben Mathew; Roberto Mattiuzzo; Laura Tarantini; Cy Hay; Salvatore Talluto 001; Thomas W. Williams (DDECS, 2007)