High Level Test Economics Advisor (Hi-TEA). - Magdy S. Abadir; Ashish Parikh; Linda Bal; Peter Sandborn; Cynthia F. Murphy (J. Electron. Test., 1994)

Economic Analysis of Test Process Flows for Multichip Modules Using Known Good Die. - Cynthia F. Murphy; Magdy S. Abadir; Peter Sandborn (J. Electron. Test., 1997)