A Comparative Study of Predictive Current Control Schemes for a Permanent-Magnet Synchronous Machine Drive. - Florent Morel; Xuefang Lin-Shi; Jean-Marie Retif; Bruno Allard; Cyril Buttay (IEEE Trans. Ind. Electron., 2009)

Migration issues in sintered-silver die attaches operating at high temperature. - Raphel Riva; Cyril Buttay; Bruno Allard; Pascal Bevilacqua (Microelectron. Reliab., 2013)

Study of die attach technologies for high temperature power electronics: Silver sintering and gold-germanium alloy. - Wissam Sabbah; Stephane Azzopardi; Cyril Buttay; Régis Meuret; Eric Woirgard (Microelectron. Reliab., 2013)

Fabrication and characterization of a planar interleaved micro-transformer with magnetic core. - Faouzi Kahlouche; Khamis Youssouf; Mahamat Hassan Béchir; Stéphane Capraro; Ali Siblini; Jean-Pierre Chatelon; Cyril Buttay; Jean Jacques Rousseau (Microelectron. J., 2014)

Study of short-circuit robustness of SiC MOSFETs, analysis of the failure modes and comparison with BJTs. - Cheng Chen; Denis Labrousse; Stéphane Lefebvre; Mickael Petit; Cyril Buttay; Hervé Morel (Microelectron. Reliab., 2015)

Avalanche robustness of SiC Schottky diode. - Ilyas Dchar; Cyril Buttay; Hervé Morel (Microelectron. Reliab., 2016)

SiC power devices packaging with a short-circuit failure mode capability. - Ilyas Dchar; Cyril Buttay; Hervé Morel (Microelectron. Reliab., 2017)

Characterization of materials and their interfaces in a direct bonded copper substrate for power electronics applications. - A. Ben Kabaar; Cyril Buttay; O. Dezellus; R. Estevez; Anthony Gravouil; Laurent Gremillard (Microelectron. Reliab., 2017)

Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling. - Wissam Sabbah; Faical Arabi; Oriol Avino-Salvado; Cyril Buttay; L. Théolier; Hervé Morel (Microelectron. Reliab., 2017)

High temperature ageing of microelectronics assemblies with SAC solder joints. - Wissam Sabbah; Pierre Bondue; Oriol Avino-Salvado; Cyril Buttay; Hélène Frémont; Alexandrine Guédon-Gracia; Hervé Morel (Microelectron. Reliab., 2017)

Design, manufacturing and characterization of printed circuit board embedded inductors for power applications. - Remy Caillaud; Cyril Buttay; Roberto M'Rad; Johan Le Lesle; Florent Morel; Nicolas Degrenne; Stefan Mollov; Christian Martin 003 (ICIT, 2018)

A 100 kW 1.2 kV 20 kHz DC-DC converter prototype based on the Dual Active Bridge topology. - Thomas Lagier; Laurent Chedot; François Wallart; Layal Ghossein; Bruno Lefebvre; Piotr Dworakowski; Michel Mermet-Guyennet; Cyril Buttay (ICIT, 2018)

Optimum design of a single-phase Power Pulsating Buffer (PPB) with PCB-integrated inductor technologies. - Johan Le Lesle; Remy Caillaud; Florent Morel; Nicolas Degrenne; Cyril Buttay; Roberto M'Rad; Christian Vollaire; Stefan Mollov (ICIT, 2018)

High-temperature coplanar transformer. - Maxime Semard; Christian Martin 003; Cyril Buttay; Charles Joubert (ICIT, 2018)

Packaging with Double-Side Cooling Capability for SiC Devices, Based on Silver Sintering. - Cyril Buttay; Raphel Riva; Bruno Allard; Marie-Laure Locatelli; Vincent Bley (IECON, 2018)

Threshold voltage instability in SiC MOSFETs as a consequence of current conduction in their body diode. - Oriol Avino-Salvado; Hervé Morel; Cyril Buttay; Denis Labrousse; Stéphane Lefebvre (Microelectron. Reliab., 2018)

A Study on Shunt Resistor-based Current Measurements for Fast Switching GaN Devices. - Thilini Wickramasinghe; Stephane Azzopardi; Bruno Allard; Cyril Buttay; Charles Joubert; Christian Martin 003; Jean-François Mogniotte; Hervé Morel; Pascal Bevilacqua; Thanh-Long Le (IECON, 2019)

Optical Detection of Partial Discharges Under Fast Rising Square Voltages in Dielectric Liquids. - Somya Anand; Eric Vagnon; Martin Guillet; Cyril Buttay (IEEE Access, 2022)

Phase-Shifted Full Bridge DC-DC Converter for Photovoltaic MVDC Power Collection Networks. - Pierre Le Métayer; Quentin Loeuillet; François Wallart; Cyril Buttay; Drazen Dujic; Piotr Dworakowski (IEEE Access, 2023)

Physics-Based Strategies for Fast TDDB Testing and Lifetime Estimation in SiC Power MOSFETs. - Oriol Avino-Salvado; Cyril Buttay; Ferran Bonet; Christophe Raynaud; Pascal Bevilacqua; José Rebollo; Hervé Morel; Xavier Perpiñà (IEEE Trans. Ind. Electron., 2024)