Evaluation of Al(Nd)-alloy films for application to thin-film-transistor liquid crystal displays. - Hiroshi Takatsuji; Evan G. Colgan; Cyril Cabral Jr.; James M. E. Harper (IBM J. Res. Dev., 1998)

(Ba, Sr)TiO3 dielectrics for future stacked- capacitor DRAM. - David E. Kotecki; John D. Baniecki; Hua Shen; Robert B. Laibowitz; Katherine L. Saenger; Jingyu Jenny Lian; Thomas M. Shaw; Satish D. Athavale; Cyril Cabral Jr.; Peter R. Duncombe; Martin Gutsche; Gerhard Kunkel; et al. (IBM J. Res. Dev., 1999)

Single-event-upset and alpha-particle emission rate measurement techniques. - Michael S. Gordon; Kenneth P. Rodbell; David F. Heidel; Cyril Cabral Jr.; Ethan H. Cannon; Daniel D. Reinhardt (IBM J. Res. Dev., 2008)

Alpha-particle-induced upsets in advanced CMOS circuits and technology. - David F. Heidel; Kenneth P. Rodbell; Ethan H. Cannon; Cyril Cabral Jr.; Michael S. Gordon; Phil Oldiges; Henry H. K. Tang (IBM J. Res. Dev., 2008)