An up-stream design auto-fix flow for manufacturability enhancement. - Jie Yang 010; Ethan Cohen; Cyrus Tabery; Norma Rodriguez; Mark Craig (DAC, 2006)

Bridging the Gap Between Layout Pattern Sampling and Hotspot Detection via Batch Active Learning. - Haoyu Yang; Shuhe Li; Cyrus Tabery; Bingqing Lin; Bei Yu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021)