Digital circuits reliability with in-situ monitors in 28nm fully depleted SOI. - M. Saliva; Florian Cacho; Vincent Huard; X. Federspiel; D. Angot; Ahmed Benhassain; Alain Bravaix; Lorena Anghel (DATE, 2015)

From BTI variability to product failure rate: A technology scaling perspective. - Vincent Huard; D. Angot; Florian Cacho (IRPS, 2015)

Impact of gate oxide breakdown in logic gates from 28nm FDSOI CMOS technology. - M. Saliva; Florian Cacho; Cheikh Ndiaye; Vincent Huard; D. Angot; Alain Bravaix; Lorena Anghel (IRPS, 2015)