Evaluation methodology of thin dielectrics for non-volatile memory application. - G. Ghidini; D. Brazzelli (Microelectron. Reliab., 2002)

Anomalous gate oxide conduction on isolation edges: analysis and process optimization. - Andrea Ghetti; D. Brazzelli; A. Benvenuti; G. Ghidini; Alessia Pavan (Microelectron. Reliab., 2003)

Impact of interface and bulk trapped charges on transistor reliability. - G. Ghidini; M. Langenbuch; R. Bottini; D. Brazzelli; Andrea Ghetti; N. Galbiati; G. Giusto; A. Garavaglia (Microelectron. Reliab., 2005)