D. Bru

According to our database, D. Bru authored at least 2 papers between 2002 and 2003.

Collaborative distances:

• no known Dijkstra number.
• no known Erdős number.

2003

Gate oxide breakdown characterization on 0.13mum CMOS technology.

D. Faure, D. Bru, C. Ali, C. Giret, K. Christensen

Microelectron. Reliab., 2003

2002

Electrical characteristics measurement of transistors by 4 tips-0.2 micron probing technique in Semiconductor Failure Analysis.

C. Giret, D. Bru, D. Faure, C. Ali, M. Razani, D. Gobled

Microelectron. Reliab., 2002