Computer-aided design of a mass production circuit. - Yu Lin; Say Wei Foo; D. C. L. (Erik) van Geest (ICECS, 1999)

System-level DFT for consumer products. - D. C. L. (Erik) van Geest; Frans G. M. de Jong (ETW, 2001)

Testing and programming flash memories on assemblies during high volume production. - Frans G. M. de Jong; Alex S. Biewenga; D. C. L. (Erik) van Geest; T. F. Waayers (ITC, 2001)

On-Chip Mixed-Signal Test Structures Re-used for Board Test. - Rodger Schuttert; D. C. L. (Erik) van Geest; A. Kumar (ITC, 2004)