Effective Screening of Automotive SoCs by Combining Burn-In and System Level Test. - F. Almeida; Paolo Bernardi; D. Calabrese; Marco Restifo; Matteo Sonza Reorda; Davide Appello; Giorgio Pollaccia; Vincenzo Tancorre; Roberto Ugioli; Gulio Zoppi (DDECS, 2019)