Characterisation of series resistance degradation through charge pumping technique. - S. K. Manhas; D. Chandra Sekhar; A. S. Oates; Merlyne M. De Souza (Microelectron. Reliab., 2003)

Influence of mobility model on extraction of stress dependent source-drain series resistance. - Merlyne M. De Souza; S. K. Manhas; D. Chandra Sekhar; A. S. Oates; Prasad Chaparala (Microelectron. Reliab., 2004)

Fractal boundaries of basin of attraction of Newton-Raphson method in helicopter trim. - D. Chandra Sekhar; Ranjan Ganguli (Comput. Math. Appl., 2010)