Algorithmic Extraction of BSDL from 1149.1-compliant Sample ICs. - Douglas W. Raymond; D. Eugene Wedge; Philip J. Stringer; Harold W. Ng; Suzanne T. Jennings; Craig T. Pynn; Winsor Soule Jr. (ITC, 1995)

A Roadmap for Boundary-Scan Test Reuse. - D. Eugene Wedge; Tom Conner (ITC, 1996)