The Impact of Scaling on the Effects of Mixed-Mode Electrical Stress and Ionizing Radiation for 130-nm and 90-nm SiGe HBTs. - Delgermaa Nergui; Mozhgan Hosseinzadeh; Y. A. Mensah; Harrison P. Lee; D. G. Sam; K. Li; E. X. Zhang; Daniel M. Fleetwood; John D. Cressler (IRPS, 2024)