Conduction band states of transition metal (TM) high-k gate dielectrics as determined from X-ray absorption spectra. - Gerald Lucovsky; J. G. Hong; Charles C. Fulton; N. A. Stoute; Y. Zou; Robert J. Nemanich; David E. Aspnes; H. Ade; D. G. Schlom (Microelectron. Reliab., 2005)