Analysis of ESD failure mechanism in 65nm bulk CMOS ESD NMOSFETs with ESD implant. - David Alvarez; Michel J. Abou-Khalil; Christian Russ; Kiran V. Chatty; Robert Gauthier 002; D. Kontos; Junjun Li; Christopher Seguin; Ralph Halbach (Microelectron. Reliab., 2006)