Alternating Temperature Stress and Deduction of Effective Stress Levels from Mission Profiles for Semiconductor Reliability. - Alexander Hirler; Adnan Alsioufy; Josef Biba; T. Lehndorff; D. Lipp; Helmut Lochner; Mahesh Siddabathula; S. Simon; Torsten Sulima; Maciej Wiatr; Walter Hansch (IRPS, 2019)

A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. - Wafa Arfaoui; Germain Bossu; A. Muehlhoff; D. Lipp; R. Manuwald; T. Chen; Tanya Nigam; Mahesh Siddabathula (IRPS, 2020)

22FDX™ 5G 28GHz 20dBm Power Amplifier Constant Load and VSWR accelerated aging reliability. - Germain Bossu; Shafi Syed; S. Evseev; Joris Angelo Sundaram Jerome; Wafa Arfaoui; D. Lipp; Mahesh Siddabathula (IRPS, 2022)

Excellent Reliability performances of a truly 5V nBOXFET for Automotive and IOT applications. - D. Lipp; Z. Zhao; G. Krause; Wafa Arfaoui; Elodie Ebrard; Germain Bossu; S. Evseev; Markus Herklotz; Mahesh Siddabathula (IRPS, 2023)