An investigation of capacitance aging model for extreme low-k and high-k dielectrics. - M. N. Chang; Y.-H. Lee; S. Y. Lee; C. C. Chiu; D. Maji; K. Wu (IRPS, 2015)

Delay effects and frequency dependence of NBTI with sub-microsecond measurements. - Y.-C. Huang; M.-H. Hsieh; T.-Y. Yew; W. Wang; D. Maji; Y.-H. Lee; W.-S. Chou; P.-Z. Kang (IRPS, 2015)