A Reliability Overview of Intel's 10+ Logic Technology. - Rohit Grover; Tony Acosta; C. AnDyke; Emre Armagan; C. Auth; Sunny Chugh; K. Downes; M. Hattendorf; N. Jack; S. Joshi; R. Kasim; Gerald S. Leatherman; et al. (IRPS, 2020)

Method to evaluate off-state breakdown in scaled Tri-gate technologies. - D. Nminibapiel; K. Joshi; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2022)

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies. - K. Joshi; D. Nminibapiel; M. Ghoneim; D. Ali; R. Ramamurthy; L. Pantisano; Inanc Meric; Stephen Ramey (IRPS, 2023)