Guidelines for intermediate back end of line (BEOL) for 3D sequential integration. - Claire Fenouillet-Béranger; S. Beaurepaire; Fabien Deprat; Alexandre Ayres De Sousa; Laurent Brunet; Perrine Batude; Olivier Rozeau; François Andrieu; Paul Besombes; M.-P. Samson; Bernard Previtali; F. Nemouchi; et al. (ESSDERC, 2017)

Integrated Test Structures for Reliability Investigation under Dynamic Stimuli. - Florian Cacho; D. Nouguier; M. Arabi; X. Federspiel; Y. Carminati; M. Saliva (IOLTS, 2018)

New NBTI models for degradation and relaxation kinetics valid over extended temperature and stress/recovery ranges. - D. Nouguier; X. Federspiel; Gérard Ghibaudo; M. Rafik; David Roy 001 (Microelectron. Reliab., 2018)

Investigation of NBTI Dynamic Behavior with Ultra-Fast Measurement. - Florian Cacho; X. Federspiel; D. Nouguier; Cheikh Diouf (IRPS, 2019)