Effects of the electrical stress on the conduction characteristics of metal gate/MgO/InP stacks. - Enrique Miranda 002; Javier Martín-Martínez; Eamon O'Connor; G. Hughes; P. Casey; Karim Cherkaoui; S. Monaghan; R. Long; D. O'Connell; Paul K. Hurley (Microelectron. Reliab., 2009)