Reliability of planar, Super-Junction and trench low voltage power MOSFETs. - Antonio Testa; Salvatore De Caro; Saverio Panarello; Salvatore Patanè; Sebastiano Russo; D. Patti; S. Poma; Romeo Letor (Microelectron. Reliab., 2010)

High temperature long term stability of SiC Schottky diodes. - Antonio Testa; Salvatore De Caro; Sebastiano Russo; D. Patti; Lucia Torrisi (Microelectron. Reliab., 2011)

Improving ICs reliability with high speed thermal mapping. - Saverio Panarello; Claudia Triolo; F. Garesci; Salvatore Patanè; Giuseppina Billè; D. Patti; L. Burian; D. Gazzo; Sandor Petenyi; Calogero Ribellino (SMACD, 2017)