Yield Optimization by Design Centering and Worst-Case Distance Analysis. - G. S. Samudra; H. M. Chen; D. S. H. Chan; Yaacob Ibrahim (ICCD, 1999)

Global optimization for digital MOS circuits performance. - H. M. Chen; G. S. Samudra; D. S. H. Chan; Yaacob Ibrahim (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000)

Single contact optical beam induced currents. - J. M. Chin; J. C. H. Phang; D. S. H. Chan; M. Palaniappan; G. Gilfeather; C. E. Soh (Microelectron. Reliab., 2001)

Single contact beam induced current phenomenon for microelectronic failure analysis. - J. C. H. Phang; D. S. H. Chan; V. K. S. Ong; S. Kolachina; J. M. Chin; M. Palaniappan; G. Gilfeather; Y. X. Seah (Microelectron. Reliab., 2003)