Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. - B. Kojecký; Václav Papez; D. Sámal (Microelectron. J., 2006)

Reliability of reverse properties of power semiconductor devices: : Influence of surface dielectric layer and its experimental verification. - Václav Papez; B. Kojecký; D. Sámal (Microelectron. J., 2008)