Interactive telecommunications access by computer to design characteristics of the nation's nuclear power stations. - D. W. Cardwell (AFIPS Fall Joint Computing Conference (1), 1968)

Deep trap-induced dynamic on-resistance degradation in GaN-on-Si power MISHEMTs. - A. Sasikumar; Aaron R. Arehart; D. W. Cardwell; C. M. Jackson; W. Sun; Z. Zhang; S. A. Ringel (Microelectron. Reliab., 2016)