A built-in redundancy-analysis scheme for RAMs with 2D redundancy using 1D local bitmap. - Tsu-Wei Tseng; Jin-Fu Li 001; Da-Ming Chang (DATE, 2006)

A Built-In Redundancy-Analysis Scheme for Self-Repairable RAMs with Two-Level Redundancy. - Yu-Jen Huang; Da-Ming Chang; Jin-Fu Li 001 (DFT, 2006)

A Built-In Redundancy-Analysis Scheme for Random Access Memories with Two-Level Redundancy. - Da-Ming Chang; Jin-Fu Li 001; Yu-Jen Huang (J. Electron. Test., 2008)