Phase analysis of coaxial short and open circuits. - Jin-Seob Kang; Jeong-Hwan Kim; Dae-Chan Kim (IEEE Trans. Instrum. Meas., 2005)

Fabrication of Small Reference Probe and Its Application. - No-Weon Kang; Jin-Seob Kang; Dae-Chan Kim; Jeong-Hwan Kim (IEEE Trans. Instrum. Meas., 2007)

Characterization Method of Electric Field Probe by Using Transfer Standard in GTEM Cell. - No-Weon Kang; Jin-Seob Kang; Dae-Chan Kim; Jeong-Hwan Kim; Joo-Gwang Lee (IEEE Trans. Instrum. Meas., 2009)

Determining Noise Temperature of a Noise Source Using Calibrated Noise Sources and an RF Attenuator. - Tae-Weon Kang; Jeong-Hwan Kim; Joo-Gwang Lee; Jeong-Il Park; Dae-Chan Kim (IEEE Trans. Instrum. Meas., 2011)

Uncertainty Analysis in EVM Measurement Using a Monte Carlo Simulation. - Chihyun Cho; Joo-Gwang Lee; Jeong-Hwan Kim; Dae-Chan Kim (IEEE Trans. Instrum. Meas., 2015)