Comparative study of NBTI as a function of Si film orientation and thickness in SOI pMOSFETs. - Sung Jun Jang; Dae Hyun Ka; Chong-Gun Yu; Kwan-Su Kim; Won-Ju Cho; Jong Tae Park 003 (Microelectron. Reliab., 2007)

NBTI and hot carrier effect of SOI p-MOSFETs fabricated in strained Si SOI wafer. - Yong Woo Jeon; Dae Hyun Ka; Chong-Gun Yu; Won-Ju Cho; M. Saif Islam; Jong Tae Park 003 (Microelectron. Reliab., 2009)