Reliability of Industrial grade Embedded-STT-MRAM. - Yongsung Ji; Hyunjae Goo; Jungman Lim; Tae-Young Jeong; Taiki Uemura; Gun Rae Kim; Boil Seo; Seungbae Lee; Goeun Park; Jeongmin Jo; Sang-Il Han; Kilho Lee; et al. (IRPS, 2020)

Algorithmic Read Resistance Trim for Improving Yield and Reducing Test Time in MRAM. - Daehyun Chang; Youngdae Kim; Suksoo Pyo; Shin Hun; Daesop Lee; Sohee Hwang; Jaesik Choi; Siwoong Kim (ITC, 2023)