Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit. - Taiki Uemura; Soonyoung Lee; Dahye Min; Ihlhwa Moon; Jungman Lim; Seungbae Lee; Hyun-Chul Sagong; Sangwoo Pae (IRPS, 2018)

SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET. - Taiki Uemura; Soonyoung Lee; Dahye Min; Ihlhwa Moon; Seungbae Lee; Sangwoo Pae (IRPS, 2019)