Enhancing Wafer Probing With SwinProbeFormer: Self-Supervised Anomaly Detection via Window-Based Swin Transformer. - Hyekyung Yoon; Dahyun Won; Sohyung Kim; Yuseop Lee; Kiljae Lee; Kyungja Park; Jaehoon Joo; Jangwon Seo; Youngsoo Ha; Myungjoo Kang (IEEE Access, 2025)