Evaluation of Surface States of AlGaN/GaN HFET Using Open-Gated Structure. - Daigo Kikuta; Jin-Ping Ao; Yasuo Ohno (IEICE Trans. Electron., 2005)

A Mechanism of Enhancement-Mode Operation of AlGaN/GaN MIS-HFET. - Daigo Kikuta; Jin-Ping Ao; Junya Matsuda; Yasuo Ohno (IEICE Trans. Electron., 2006)

Temperature and Illumination Dependence of AlGaN/GaN HFET Threshold Voltage. - Masaya Okada; Ryohei Takaki; Daigo Kikuta; Jin-Ping Ao; Yasuo Ohno (IEICE Trans. Electron., 2006)

Reliability issues of gate oxides and $p-n$ junctions for vertical GaN metal-oxide-semiconductor field-effect transistors (Invited). - Tetsuo Narita; Daigo Kikuta; Kenji Ito; Tomoyuki Shoji; Tomohiko Mori; Satoshi Yamaguchi; Yasuji Kimoto; Kazuyoshi Tomita; Masakazu Kanechika; Takeshi Kondo; Tsutomu Uesugi; Jun Kojima; et al. (IRPS, 2023)