Systematic Error Detection for RFID Reliability. - Sozo Inoue; Hiroto Yasuura; Daisuke Hagiwara (ARES, 2006)

Theoretical and Experimental Verification of Reflection Phase Change based on Time-Frequency Analysis on Microwave Radar. - Yuito Yamada; Daisuke Hagiwara; Jun-Ya Takayama (SICE, 2019)