High Precision Measurement of Sub-Nano Ampere Current in ATE Environment. - Keno Sato; Takayuki Nakatani; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Gaku Ogihara; Daisuke Iimori; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kazumi Hatayama; et al. (ATS, 2021)

Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production. - Gaku Ogihara; Takayuki Nakatani; Daisuke Iimori; Shogo Katayama; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Jianglin Wei; Kazumi Hatayama; et al. (ICECS, 2021)

Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer. - Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Akemi Hatta; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Jianglin Wei; Yujie Zhao; et al. (ITC, 2021)

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST. - Keno Sato; Takayuki Nakatani; Shogo Katayama; Daisuke Iimori; Gaku Ogihara; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Yujie Zhao; Kentaroh Katoh; Anna Kuwana; Kazumi Hatayama; et al. (ATS, 2022)

Innovative Practices Track: Innovative Analog Circuit Testing Technologies. - Chris Mangelsdorf; Manasa Madhvaraj; Salvador Mir; Manuel J. Barragán; Daisuke Iimori; Takayuki Nakatani; Shogo Katayama; Gaku Ogihara; Yujie Zhao; Jianglin Wei; Anna Kuwana; Kentaroh Katoh; et al. (VTS, 2022)

Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion. - Keno Sato; Takayuki Nakatani; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Shogo Katayama; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Shuhei Yamamoto; Anna Kuwana; Kentaroh Katoh; et al. (ITC, 2023)

Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing. - Shogo Katayama; Takayuki Nakatani; Daisuke Iimori; Misaki Takagi; Yujie Zhao; Anna Kuwana; Keno Sato; Takashi Ishida 003; Toshiyuki Okamoto; Tamotsu Ichikawa; Kentaroh Katoh; Kazumi Hatayama; et al. (IEICE Electron. Express, 2023)