250-MHz advanced test systems. - Algirdas J. Gruodis; Dale E. Hoffman (IEEE Des. Test, 1988)

Testing the 400-MHz IBM Generation-4 CMOS Chip. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko (ITC, 1997)

Advanced microprocessor test strategy and methodology. - William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko; Stephen Pateras; Dale E. Hoffman; Timothy G. McNamara; Thomas J. Snethen (IBM J. Res. Dev., 1997)

Design methodology for the S/390 Parallel Enterprise Server G4 microprocessors. - Kenneth L. Shepard; Sean M. Carey; Ee Kin Cho; Brian W. Curran; Robert F. Hatch; Dale E. Hoffman; Scott A. McCabe; Gregory A. Northrop; A. E. (Rick) Seigler (IBM J. Res. Dev., 1997)

Deep submicron design techniques for the 500 MHz IBM S/390 G5 custom microprocessor. - Dale E. Hoffman; Robert M. Averill III; Brian W. Curran; Yuen H. Chan; Allan H. Dansky; Robert F. Hatch; Timothy G. McNamara; Thomas J. McPherson; Gregory A. Northrop; Leon J. Sigal; Anthony Pelella; Patrick M. Williams (ICCD, 1998)

Testing the 500-MHz IBM S/390 Microprocessor. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Mary P. Kusko; Bryan J. Robbins (IEEE Des. Test Comput., 1998)

Chip integration methodology for the IBM S/390 G5 and G6 custom microprocessors. - Robert M. Averill III; Keith G. Barkley; Michael A. Bowen; Peter J. Camporese; Allan H. Dansky; Robert F. Hatch; Dale E. Hoffman; Mark D. Mayo; Scott A. McCabe; Timothy G. McNamara; Thomas J. McPherson; Gregory A. Northrop; et al. (IBM J. Res. Dev., 1999)

Homegrown Tools and Equipment versus EDA and ATE Vendors: The Future of Design to Test Product Lines. - Dale E. Hoffman (ITC, 2002)