Early Life Cycle Yield Learning for Nanometer Devices Using Volume Yield Diagnostics Analysis. - Sanae Seike; Ken Namura; Yukio Ohya; Anis Uzzaman; Shinichi Arima; Dale Meehl; Vivek Chickermane; Azumi Kobayashi; Satoshi Tanaka; Hiroyuki Adachi (ATS, 2006)

Achieving serendipitous N-detect mark-offs in Multi-Capture-Clock scan patterns. - Gaurav Bhargava; Dale Meehl; James Sage (ITC, 2007)

A Partially-Exhaustive Gate Transition Fault Model. - Brion L. Keller; Dale Meehl; Anis Uzzaman; Richard Billings (Asian Test Symposium, 2009)

LBIST/ATPG Technologies for On-Demand Digital Logic Testing in Automotive Circuits. - Dale Meehl; Bassilios Petrakis; Ping Zhang (Asian Test Symposium, 2012)

Advancing test compression to the physical dimension. - Krishna Chakravadhanula; Vivek Chickermane; Paul Cunningham; Brian Foutz; Dale Meehl; Louis Milano; Christos Papameletis; David Scott; Steev Wilcox (ITC, 2017)