On Scan Chain Diagnosis for Intermittent Faults. - Dan Adolfsson; Joanna Siew; Erik Jan Marinissen; Erik Larsson (Asian Test Symposium, 2009)

Defect-oriented cell-aware ATPG and fault simulation for industrial cell libraries and designs. - Friedrich Hapke; Rene Krenz-Baath; Andreas Glowatz; Jürgen Schlöffel; Hamidreza Hashempour; Stefan Eichenberger; Camelia Hora; Dan Adolfsson (ITC, 2009)