Electrically Programmable Fuse (eFUSE): From Memory Redundancy to Autonomic Chips. - Norman Robson; John Safran; Chandrasekharan Kothandaraman; Alberto Cestero; Xiang Chen; Raj Rajeevakumar; Alan Leslie; Dan Moy; Toshiaki Kirihata; Subramanian S. Iyer (CICC, 2007)

Oxygen vacancy traps in Hi-K/Metal gate technologies and their potential for embedded memory applications. - Chandrasekharan Kothandaraman; X. Chen; Dan Moy; Dallas Lea; Sami Rosenblatt; Faraz Khan; Derek Leu; Toshiaki Kirihata; D. Ioannou; Giuseppe La Rosa; Jeffrey B. Johnson; Norman Robson; et al. (IRPS, 2015)

80Kb 10ns read cycle logic Embedded High-K charge trap Multi-Time-Programmable Memory scalable to 14nm FIN with no added process complexity. - Janakiraman Viraraghavan; Derek Leu; Balaji Jayaraman; Alberto Cestero; Robert Kilker; Ming Yin; John Golz; Rajesh Reddy Tummuru; Ramesh Raghavan; Dan Moy; Thejas Kempanna; Faraz Khan; et al. (VLSI Circuits, 2016)

80-kb Logic Embedded High-K Charge Trap Transistor-Based Multi-Time-Programmable Memory With No Added Process Complexity. - Balaji Jayaraman; Derek Leu; Janakiraman Viraraghavan; Alberto Cestero; Ming Yin; John Golz; Rajesh Reddy Tummuru; Ramesh Raghavan; Dan Moy; Thejas Kempanna; Faraz Khan; Toshiaki Kirihata; et al. (IEEE J. Solid State Circuits, 2018)

Polarization mode dispersion in CMOS-integrated monolithic SiPh components: simulations and experiments. - Yusheng Bian; Hanyi Ding; Abdelsalam Aboketaf; Vaishnavi Karra; Massimo Sorbara; Takako Hirokawa; Salman Mosleh; Crystal Hedges; Won Suk Lee; Sujith Chandran; Avijit Chatterjee; Riddhi Nandi; et al. (OFC, 2023)

Self-aligned Fiber Attach on Monolithic Silicon Photonic Chips: Moisture Effect and Hermetic Seal. - Zhuo-Jie Wu; Ping-Chuan Wang; Seungman Choi; Patrick Justison; Martin Gall; Jae Kyu Cho; Takako Hirokawa; Yusheng Bian; Thomas Houghton; Vaishnavi Karra; Dan Moy; Karen Nummy; et al. (OFC, 2023)