Process-variability aware delay fault testing of ΔVT and weak-open defects. - Daniel Arumí-Delgado; Rosa Rodríguez-Montañés; José Pineda de Gyvez; Guido Gronthoud (ETW, 2003)

Defective behaviours of resistive opens in interconnect lines. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (ETS, 2005)

Diagnosis of Bridging Defects Based on Current Signatures at Low Power Supply Voltages. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Diagnosis of Full Open Defects in Interconnecting Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman; Maurice Lousberg; Ananta K. Majhi (VTS, 2007)

Time-dependent Behaviour of Full Open Defects in Interconnect Lines. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ITC, 2008)

Full Open Defects in Nanometric CMOS. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (VTS, 2008)

Experimental Characterization of CMOS Interconnect Open Defects. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008)

Delay caused by resistive opens in interconnecting lines. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (Integr., 2009)

Diagnosis of full open defects in interconnect lines with fan-out. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (ETS, 2010)

Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011)

Gate Leakage Impact on Full Open Defects in Interconnect Lines. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Very Large Scale Integr. Syst., 2011)

BIST architecture to detect defects in tsvs during pre-bond testing. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (ETS, 2013)

Diagnosis of Interconnect Full Open Defects in the Presence of Gate Leakage Currents. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras; Stefan Eichenberger; Camelia Hora; Bram Kruseman (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013)

Post-bond test of Through-Silicon Vias with open defects. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras (ETS, 2014)

Pre-bond testing of weak defects in TSVs. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (IOLTS, 2014)

RRAM based cell for hardware security applications. - Daniel Arumí; Salvador Manich; Rosa Rodríguez-Montañés (IVSW, 2016)

Prebond Testing of Weak Defects in TSVs. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents. - Daniel Arumí; Rosa Rodríguez-Montañés; Joan Figueras (IEEE Trans. Very Large Scale Integr. Syst., 2016)

Postbond Test of Through-Silicon Vias With Resistive Open Defects. - Rosa Rodríguez-Montañés; Daniel Arumí; Joan Figueras (IEEE Trans. Very Large Scale Integr. Syst., 2019)

A forming-free ReRAM cell with low operating voltage. - Binbin Yang; Nuo Xu; Cheng Li; Chenglong Huang; Desheng Ma; Jiahao Liu; Daniel Arumí; Liang Fang (IEICE Electron. Express, 2020)

Low Cost AES Protection Against DPA Using Rolling Codes. - P. Albiol; Salvador Manich; Daniel Arumí; Rosa Rodríguez-Montañés; Álvaro Gómez-Pau (DCIS, 2021)

Simulation of serial RRAM cell based on a Verilog-A compact model. - Binbin Yang; Daniel Arumí; Salvador Manich; Álvaro Gómez-Pau; Rosa Rodríguez-Montañés; Juan Bautista Roldán; Mireia Bargallo González; Francesca Campabadal; Liang Fang (DCIS, 2021)

On the Fitting and Improvement of RRAM Stanford-Based Model Parameters Using TiN/Ti/HfO2/W Experimental Data. - V. Mahboubi; Daniel Arumí; Álvaro Gómez-Pau; Rosa Rodríguez-Montañés; Salvador Manich (DCIS, 2022)

True Random Number Generator Based on the Variability of the High Resistance State of RRAMs. - Maryam Akbari; Sattar Mirzakuchaki; Daniel Arumí; Salvador Manich; Álvaro Gómez-Pau; Francesca Campabadal; Mireia Bargallo González; Rosa Rodríguez-Montañés (IEEE Access, 2023)

Engineering UGR-VCMTCF RRAM Model for Adjusting to TiN/Ti/HfO2/W Devices. - V. Mahboubi; Á. Gómez; Antonio Calomarde; Daniel Arumí; R. Rodríguez; Salvador Manich (DCIS, 2024)

On the Fine Tuning of RRAM Resistance Under Variability Using Current Pulses at SET. - V. Mahboubi; Á. Gómez; Antonio Calomarde; Daniel Arumí; R. Rodríguez; Salvador Manich (IOLTS, 2024)