Transistor Hot Carrier Reliability Assurance in CMOS Technologies. - Daniel B. Jackson; David A. Bell; Brian S. Doyle; Bruce J. Fishbein; David B. Krakauer (Digit. Tech. J., 1992)

Power Considerations in the Design of the Alpha 21264 Microprocessor. - Michael K. Gowan; Larry L. Biro; Daniel B. Jackson (DAC, 1998)

Testability access of the high speed test features in the Alpha 21264 microprocessor. - Dilip K. Bhavsar; David R. Akeson; Michael K. Gowan; Daniel B. Jackson (ITC, 1998)