Variance reduction using wafer patterns in I_ddQ data. - W. Robert Daasch; James McNames; Daniel Bockelman; Kevin Cota (ITC, 2000)

Design validation on multiple-core CPU supported low power states using platform based infrared emission microscopy (PIREM) technique. - Yuan-Chuan Steven Chen; Dave Budka; Auston Gibertini; Dan Bockelman; Yutien Lin (VLSI-DAT, 2012)