Dynamic intrinsic chip ID using 32nm high-K/metal gate SOI embedded DRAM. - Daniel Fainstein; Sami Rosenblatt; Alberto Cestero; Norman Robson; Toshiaki Kirihata; Subramanian S. Iyer (VLSIC, 2012)

Field Tolerant Dynamic Intrinsic Chip ID Using 32 nm High-K/Metal Gate SOI Embedded DRAM. - Sami Rosenblatt; Daniel Fainstein; Alberto Cestero; John Safran; Norman Robson; Toshiaki Kirihata; Subramanian S. Iyer (IEEE J. Solid State Circuits, 2013)