SIM Comparison of DC Resistance Standards at 1Ω, 1MΩ, and 1GΩ. - Dean G. Jarrett; Randolph E. Elmquist; Nien Fan Zhang; Alejandra Tonina; Marta Porfiri; Janice de Brito Fernandes; Helio Schechter; Daniel Izquierdo 003; Carlos Faverio; Daniel Slomovitz; David Inglis; Kai Wendler; et al. (IEEE Trans. Instrum. Meas., 2009)

Determination of Voltage Dependence in High-Voltage Standard Capacitors. - Daniel Slomovitz; Marcelo Brehm; Daniel Izquierdo 003; Carlos Faverio; Jose Luis Casais; Marcelo H. Cazabat (IEEE Trans. Instrum. Meas., 2019)